Eldridge Mount

What, Why and How Do We Measure Substrate Properties? Part 6 Members Public

In this installment, I think I will tackle “adhesion” testing. There are many adhesion tests...

Alex Nevels
Adhesives, Coatings & Substrates

Formulating Substrates for Winding in Vacuum Metallization Members Public

Presented by Eldridge M. Mount III, EMMOUNT Technologies LLC This talk will focus on the special formulation requirements of vacuum metallization substrates. In particular it will look at the special requirements for winding and transporting films in vacuum. A review of existing substrate slip and antiblock technologies and their relative

Kevin Lifsey
Conference Proceedings

Substrate Secrets: What, why and how do we measure substrate properties? Part 3 Members Public

As I have said before, substrates harbor many secrets. Some are easy to discern; some are not. Critical properties should be measured and controlled to ensure accurate property levels are met or known. I will continue with what properties should be measured, along with a discussion on how to use

Alex Nevels
Converting Quarterly

Substrate Secrets: Why, why and how do we measure substrate properties? Part 4 Members Public

My last column focused on control charts, which are how we effectively use and understand the measurements we make and their impact on product quality. Now let’s get back to some film measurements. We already looked at film appearance, so the topic that I will focus on now will

Alex Nevels
Converting Quarterly

SUBSTRATE SECRETS | What, why, and how do we measure substrate properties? Part 1 Members Public

Substrates harbor many secrets. Some are easy to discern (such as haze and gloss), while others (such as barrier, tensile strength or heat-sealing properties) can’t be known by simple visual appearance. However, they should all be measured to ensure accurate property levels are met or known. But which properties

Alex Nevels
Converting Quarterly