Substrate Secrets: Why, why and how do we measure substrate properties? Part 4

Alex Nevels

My last column focused on control charts, which are how we effectively use and understand the measurements we make and their impact on product quality. Now let’s get back to some film measurements. We already looked at film appearance, so the topic that I will focus on now will be the Coefficient of Friction (CoF). CoF is a surface property that measures the interaction of the moving substrate with a contacting surface or against itself.

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