Ian Bain

Broadband Interferometry - A Non-contact Optical Method for Measuring the thickness of Transparent Thin Films and Coatings Members Public

Presented by Ian Bain, Scalar Technologies Ltd. "Fringe counting” has long been employed to estimate small changes in film thickness. Recent advances in modern optics and electronics have made it possible to automate this and produce a thin film measurement system which is fast, accurate and easy to use.

Kevin Lifsey
Conference Proceedings